Il-soo Lee, Yong Min Hur, Tony Ambler. The Efficient Multiple Scan Chain Architecture Reducing Power Dissipation and Test Time. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. pages 94-97, IEEE Computer Society, 2004. [doi]
@inproceedings{LeeHA04,
title = {The Efficient Multiple Scan Chain Architecture Reducing Power Dissipation and Test Time},
author = {Il-soo Lee and Yong Min Hur and Tony Ambler},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/ats/2004/2235/00/22350094abs.htm},
tags = {architecture, testing},
researchr = {https://researchr.org/publication/LeeHA04},
cites = {0},
citedby = {0},
pages = {94-97},
booktitle = {13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan},
publisher = {IEEE Computer Society},
isbn = {0-7695-2235-1},
}