Kuen-Jong Lee, Tong-Yu Hsieh, Melvin A. Breuer. A novel test methodology based on error-rate to support error-tolerance. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 9, IEEE, 2005. [doi]
@inproceedings{LeeHB05, title = {A novel test methodology based on error-rate to support error-tolerance}, author = {Kuen-Jong Lee and Tong-Yu Hsieh and Melvin A. Breuer}, year = {2005}, doi = {10.1109/TEST.2005.1584081}, url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1584081}, researchr = {https://researchr.org/publication/LeeHB05}, cites = {0}, citedby = {0}, pages = {9}, booktitle = {Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005}, publisher = {IEEE}, isbn = {0-7803-9038-5}, }