Comparative study of electrical instabilities in InGaZnO thin film transistors with gate dielectrics

Seul Ki Lee, Sung Il Hong, Yeon-Ho Lee, Se-Won Lee, Won-Ju Cho, Jong-Tae Park. Comparative study of electrical instabilities in InGaZnO thin film transistors with gate dielectrics. Microelectronics Reliability, 52(9-10):2504-2507, 2012. [doi]

Abstract

Abstract is missing.