Test generation in circuits constructed by input decomposition - researchr publication authors

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Gueesang Lee, Mary Jane Irwin, Robert Michael Owens. Test generation in circuits constructed by input decomposition. In Proceedings of the 1990 IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD 1990, Cambridge, MA, USA, 17-19 September, 1990. pages 107-111, IEEE, 1990. [doi]

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