Classification of computed tomography scanner manufacturer using support vector machine

Seung-Bo Lee, Eun-Jin Jeong, Yunsik Son 0001, Dong-Joo Kim. Classification of computed tomography scanner manufacturer using support vector machine. In 5th International Winter Conference on Brain-Computer Interface, BCI 2017, Gangwon Province, South Korea, January 9-11, 2017. pages 85-87, IEEE, 2017. [doi]

Abstract

Abstract is missing.