Yeji Lee, Wonyeong Jang, Kyungbae Kwon, Jihun Park, Changhyun Yoo, Jeesoo Chang, Jongwook Jeon. Investigation on the Effects of Interconnect RC in 3nm Technology Node Using Path-Finding Process Design Kit. IEEE Access, 10:80695-80702, 2022. [doi]
@article{LeeJKPYCJ22,
title = {Investigation on the Effects of Interconnect RC in 3nm Technology Node Using Path-Finding Process Design Kit},
author = {Yeji Lee and Wonyeong Jang and Kyungbae Kwon and Jihun Park and Changhyun Yoo and Jeesoo Chang and Jongwook Jeon},
year = {2022},
doi = {10.1109/ACCESS.2022.3195506},
url = {https://doi.org/10.1109/ACCESS.2022.3195506},
researchr = {https://researchr.org/publication/LeeJKPYCJ22},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {10},
pages = {80695-80702},
}