Hyesun Lee, Kyo Chul Kang. Coverage and Conformance Metrics: Evaluation of Legacy Software for Software Product Line Asset Development. In Goetz Botterweck, Stan Jarzabek, Tomoji Kishi, Jaejoon Lee, Steve Livengood, editors, Software Product Lines - 14th International Conference, SPLC 2010, Jeju Island, South Korea, September 13-17, 2010. Workshop Proceedings (Volume 2 : Workshops, Industrial Track, Doctoral Symposium, Demonstrations and Tools). pages 27-32, Lancaster University, 2010. [doi]
@inproceedings{LeeK10a-1,
title = {Coverage and Conformance Metrics: Evaluation of Legacy Software for Software Product Line Asset Development},
author = {Hyesun Lee and Kyo Chul Kang},
year = {2010},
url = {http://splc2010.postech.ac.kr/SPLC2010_second_volume.pdf},
researchr = {https://researchr.org/publication/LeeK10a-1},
cites = {0},
citedby = {0},
pages = {27-32},
booktitle = {Software Product Lines - 14th International Conference, SPLC 2010, Jeju Island, South Korea, September 13-17, 2010. Workshop Proceedings (Volume 2 : Workshops, Industrial Track, Doctoral Symposium, Demonstrations and Tools)},
editor = {Goetz Botterweck and Stan Jarzabek and Tomoji Kishi and Jaejoon Lee and Steve Livengood},
publisher = {Lancaster University},
isbn = {978-1-86220-274-0},
}