Hyesun Lee, Kyo Chul Kang. Coverage and Conformance Metrics: Evaluation of Legacy Software for Software Product Line Asset Development. In Goetz Botterweck, Stan Jarzabek, Tomoji Kishi, Jaejoon Lee, Steve Livengood, editors, Software Product Lines - 14th International Conference, SPLC 2010, Jeju Island, South Korea, September 13-17, 2010. Workshop Proceedings (Volume 2 : Workshops, Industrial Track, Doctoral Symposium, Demonstrations and Tools). pages 27-32, Lancaster University, 2010. [doi]
Abstract is missing.