Jinwoo Lee, Daeil Kwon. A digital technique for diagnosing interconnect degradation by using digital signal characteristics. Microelectronics Journal, 60:87-93, 2017. [doi]
@article{LeeK17-2,
title = {A digital technique for diagnosing interconnect degradation by using digital signal characteristics},
author = {Jinwoo Lee and Daeil Kwon},
year = {2017},
doi = {10.1016/j.mejo.2016.12.008},
url = {http://dx.doi.org/10.1016/j.mejo.2016.12.008},
researchr = {https://researchr.org/publication/LeeK17-2},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {60},
pages = {87-93},
}