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Sang Hwa Lee, Hong Il Kim, Nam Ik Cho, Yu Han Jeong, Ki Suk Chung, Chung Sam Jun. Automatic defect classification using boosting. In M. Arif Wani, Mariofanna G. Milanova, Lukasz A. Kurgan, Marek Reformat, Khalid Hafeez, editors, Fourth International Conference on Machine Learning and Applications, ICMLA 2005, Los Angeles, California, USA, 15-17 December 2005. IEEE Computer Society, 2005. [doi]

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