Sang Hwa Lee, Hong Il Kim, Nam Ik Cho, Yu Han Jeong, Ki Suk Chung, Chung Sam Jun. Automatic defect classification using boosting. In M. Arif Wani, Mariofanna G. Milanova, Lukasz A. Kurgan, Marek Reformat, Khalid Hafeez, editors, Fourth International Conference on Machine Learning and Applications, ICMLA 2005, Los Angeles, California, USA, 15-17 December 2005. IEEE Computer Society, 2005. [doi]
@inproceedings{LeeKCJCJ05,
title = {Automatic defect classification using boosting},
author = {Sang Hwa Lee and Hong Il Kim and Nam Ik Cho and Yu Han Jeong and Ki Suk Chung and Chung Sam Jun},
year = {2005},
doi = {10.1109/ICMLA.2005.12},
url = {http://dx.doi.org/10.1109/ICMLA.2005.12},
tags = {classification},
researchr = {https://researchr.org/publication/LeeKCJCJ05},
cites = {0},
citedby = {0},
booktitle = {Fourth International Conference on Machine Learning and Applications, ICMLA 2005, Los Angeles, California, USA, 15-17 December 2005},
editor = {M. Arif Wani and Mariofanna G. Milanova and Lukasz A. Kurgan and Marek Reformat and Khalid Hafeez},
publisher = {IEEE Computer Society},
isbn = {0-7695-2495-8},
}