Chanhee Lee, Hanju Kim, Myungha Cho, Hyeonmo Kim, Bay Vo, Jerry Chun-Wei Lin, Philippe Fournier-Viger, Unil Yun. Incremental Top-k High Utility Pattern Mining and Analyzing Over the Entire Accumulated Dynamic Database. IEEE Access, 12:77605-77620, 2024. [doi]
Abstract is missing.