Young Seo Lee, Gunjae Koo, Young-Ho Gong, Sung Woo Chung. Stealth ECC: A Data-Width Aware Adaptive ECC Scheme for DRAM Error Resilience. In Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu, editors, 2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022. pages 382-387, IEEE, 2022. [doi]
@inproceedings{LeeKGC22,
title = {Stealth ECC: A Data-Width Aware Adaptive ECC Scheme for DRAM Error Resilience},
author = {Young Seo Lee and Gunjae Koo and Young-Ho Gong and Sung Woo Chung},
year = {2022},
doi = {10.23919/DATE54114.2022.9774775},
url = {https://doi.org/10.23919/DATE54114.2022.9774775},
researchr = {https://researchr.org/publication/LeeKGC22},
cites = {0},
citedby = {0},
pages = {382-387},
booktitle = {2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022},
editor = {Cristiana Bolchini and Ingrid Verbauwhede and Ioana Vatajelu},
publisher = {IEEE},
isbn = {978-3-9819263-6-1},
}