Ho-Yun Lee, Yeon-Jin Kim, Do-Yeon Hwang, Jin-Gyun Chung. Peak Variation Detection Using Variable Length Moving Average Filter for Defects Inspection Systems. In 2019 International SoC Design Conference, ISOCC 2019, Jeju, Korea (South), October 6-9, 2019. pages 231-232, IEEE, 2019. [doi]
Abstract is missing.