Jaesik Lee, Ki-Wook Kim, Sung-Mo Kang. VeriCDF: a new verification methodology for charged device failures. In Proceedings of the 39th Design Automation Conference, DAC 2002, New Orleans, LA, USA, June 10-14, 2002. pages 874-879, ACM, 2002. [doi]
@inproceedings{LeeKK02:1,
title = {VeriCDF: a new verification methodology for charged device failures},
author = {Jaesik Lee and Ki-Wook Kim and Sung-Mo Kang},
year = {2002},
doi = {10.1145/513918.514134},
url = {http://doi.acm.org/10.1145/513918.514134},
researchr = {https://researchr.org/publication/LeeKK02%3A1},
cites = {0},
citedby = {0},
pages = {874-879},
booktitle = {Proceedings of the 39th Design Automation Conference, DAC 2002, New Orleans, LA, USA, June 10-14, 2002},
publisher = {ACM},
isbn = {1-58113-461-4},
}