25.2 A 1.2V 8Gb 8-channel 128GB/s high-bandwidth memory (HBM) stacked DRAM with effective microbump I/O test methods using 29nm process and TSV - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Dong Uk Lee, Kyung-whan Kim, Kwan-Weon Kim, Hongjung Kim, Ju-Young Kim, Young-Jun Park, Jae-Hwan Kim, Dae Suk Kim, Heat Bit Park, Jin Wook Shin, Jang-Hwan Cho, Ki Hun Kwon, Min-Jeong Kim, Jaejin Lee, Kunwoo Park, Byong-Tae Chung, Sung-Joo Hong. 25.2 A 1.2V 8Gb 8-channel 128GB/s high-bandwidth memory (HBM) stacked DRAM with effective microbump I/O test methods using 29nm process and TSV. In 2014 IEEE International Conference on Solid-State Circuits Conference, ISSCC 2014, Digest of Technical Papers, San Francisco, CA, USA, February 9-13, 2014. pages 432-433, IEEE, 2014. [doi]

This author has not been identified. Look up 'Dong Uk Lee' in GoogleThis author has not been identified. Look up 'Kyung-whan Kim' in GoogleThis author has not been identified. Look up 'Kwan-Weon Kim' in GoogleThis author has not been identified. Look up 'Hongjung Kim' in GoogleThis author has not been identified. Look up 'Ju-Young Kim' in GoogleThis author has not been identified. Look up 'Young-Jun Park' in GoogleThis author has not been identified. Look up 'Jae-Hwan Kim' in GoogleThis author has not been identified. Look up 'Dae Suk Kim' in GoogleThis author has not been identified. Look up 'Heat Bit Park' in GoogleThis author has not been identified. Look up 'Jin Wook Shin' in GoogleThis author has not been identified. Look up 'Jang-Hwan Cho' in GoogleThis author has not been identified. Look up 'Ki Hun Kwon' in GoogleThis author has not been identified. Look up 'Min-Jeong Kim' in GoogleThis author has not been identified. Look up 'Jaejin Lee' in GoogleThis author has not been identified. Look up 'Kunwoo Park' in GoogleThis author has not been identified. Look up 'Byong-Tae Chung' in GoogleThis author has not been identified. Look up 'Sung-Joo Hong' in Google

runs on WebDSL