Youngchan Lee, Namdo Kim, Jay B. Kim, Byeong Min. Millions to thousands issues through knowledge based SoC CDC verification. In International SoC Design Conference, ISOCC 2012, Jeju Island, South Korea, November 4-7, 2012. pages 391-394, IEEE, 2012. [doi]
@inproceedings{LeeKKM12,
title = {Millions to thousands issues through knowledge based SoC CDC verification},
author = {Youngchan Lee and Namdo Kim and Jay B. Kim and Byeong Min},
year = {2012},
doi = {10.1109/ISOCC.2012.6407123},
url = {https://doi.org/10.1109/ISOCC.2012.6407123},
researchr = {https://researchr.org/publication/LeeKKM12},
cites = {0},
citedby = {0},
pages = {391-394},
booktitle = {International SoC Design Conference, ISOCC 2012, Jeju Island, South Korea, November 4-7, 2012},
publisher = {IEEE},
isbn = {978-1-4673-2989-7},
}