Classification of the Motion Artifacts in Near-infrared Spectroscopy Based on Wavelet Statistical Feature

Seung-Bo Lee, Hakseung Kim, Seho Lee, Hyun-Ji Kim, Seong-Whan Lee, Dong-Joo Kim. Classification of the Motion Artifacts in Near-infrared Spectroscopy Based on Wavelet Statistical Feature. In 2019 IEEE International Conference on Systems, Man and Cybernetics, SMC 2019, Bari, Italy, October 6-9, 2019. pages 2144-2148, IEEE, 2019. [doi]

Authors

Seung-Bo Lee

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Hakseung Kim

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Seho Lee

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Hyun-Ji Kim

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Seong-Whan Lee

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Dong-Joo Kim

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