Classification of the Motion Artifacts in Near-infrared Spectroscopy Based on Wavelet Statistical Feature

Seung-Bo Lee, Hakseung Kim, Seho Lee, Hyun-Ji Kim, Seong-Whan Lee, Dong-Joo Kim. Classification of the Motion Artifacts in Near-infrared Spectroscopy Based on Wavelet Statistical Feature. In 2019 IEEE International Conference on Systems, Man and Cybernetics, SMC 2019, Bari, Italy, October 6-9, 2019. pages 2144-2148, IEEE, 2019. [doi]

@inproceedings{LeeKLKLK19,
  title = {Classification of the Motion Artifacts in Near-infrared Spectroscopy Based on Wavelet Statistical Feature},
  author = {Seung-Bo Lee and Hakseung Kim and Seho Lee and Hyun-Ji Kim and Seong-Whan Lee and Dong-Joo Kim},
  year = {2019},
  doi = {10.1109/SMC.2019.8914331},
  url = {https://doi.org/10.1109/SMC.2019.8914331},
  researchr = {https://researchr.org/publication/LeeKLKLK19},
  cites = {0},
  citedby = {0},
  pages = {2144-2148},
  booktitle = {2019 IEEE International Conference on Systems, Man and Cybernetics, SMC 2019, Bari, Italy, October 6-9, 2019},
  publisher = {IEEE},
  isbn = {978-1-7281-4569-3},
}