Patterns of technology life cycles: stochastic analysis based on patent citations

Changyong Lee, Juram Kim, Meansun Noh, Han-Gyun Woo, KwangWook Gang. Patterns of technology life cycles: stochastic analysis based on patent citations. Techn. Analysis & Strat. Manag., 29(1), 2017. [doi]

Abstract

Abstract is missing.