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Influence of Hole Current Crowding on Snapback Breakdown in Multi-Finger MOSFETs

Siyoun Lee, Seong-Yeon Kim, Haesoon Oh, Jaesung Sim, Woo-Young Choi. Influence of Hole Current Crowding on Snapback Breakdown in Multi-Finger MOSFETs. IEEE Access, 11:60758-60762, 2023. [doi]

Authors

Siyoun Lee

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Seong-Yeon Kim

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Haesoon Oh

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Jaesung Sim

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Woo-Young Choi

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