Siyoun Lee, Seong-Yeon Kim, Haesoon Oh, Jaesung Sim, Woo-Young Choi. Influence of Hole Current Crowding on Snapback Breakdown in Multi-Finger MOSFETs. IEEE Access, 11:60758-60762, 2023. [doi]
@article{LeeKOSC23,
title = {Influence of Hole Current Crowding on Snapback Breakdown in Multi-Finger MOSFETs},
author = {Siyoun Lee and Seong-Yeon Kim and Haesoon Oh and Jaesung Sim and Woo-Young Choi},
year = {2023},
doi = {10.1109/ACCESS.2023.3285614},
url = {https://doi.org/10.1109/ACCESS.2023.3285614},
researchr = {https://researchr.org/publication/LeeKOSC23},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {11},
pages = {60758-60762},
}