Yejun Lee, Eun-Kyeong Kim, Jaejun Yoo. Towards Robust Contrail Detection by Mitigating Label Bias via a Probabilistic Deep Learning Model: A Preliminary Study. In Matthias Renz, Mario A. Nascimento, editors, Proceedings of the 31st ACM International Conference on Advances in Geographic Information Systems, SIGSPATIAL 2023, Hamburg, Germany, November 13-16, 2023. ACM, 2023. [doi]
@inproceedings{LeeKY23-3,
title = {Towards Robust Contrail Detection by Mitigating Label Bias via a Probabilistic Deep Learning Model: A Preliminary Study},
author = {Yejun Lee and Eun-Kyeong Kim and Jaejun Yoo},
year = {2023},
doi = {10.1145/3589132.3628364},
url = {https://doi.org/10.1145/3589132.3628364},
researchr = {https://researchr.org/publication/LeeKY23-3},
cites = {0},
citedby = {0},
booktitle = {Proceedings of the 31st ACM International Conference on Advances in Geographic Information Systems, SIGSPATIAL 2023, Hamburg, Germany, November 13-16, 2023},
editor = {Matthias Renz and Mario A. Nascimento},
publisher = {ACM},
}