Towards Robust Contrail Detection by Mitigating Label Bias via a Probabilistic Deep Learning Model: A Preliminary Study

Yejun Lee, Eun-Kyeong Kim, Jaejun Yoo. Towards Robust Contrail Detection by Mitigating Label Bias via a Probabilistic Deep Learning Model: A Preliminary Study. In Matthias Renz, Mario A. Nascimento, editors, Proceedings of the 31st ACM International Conference on Advances in Geographic Information Systems, SIGSPATIAL 2023, Hamburg, Germany, November 13-16, 2023. ACM, 2023. [doi]

Abstract

Abstract is missing.