Su-In Lee, Soo-Young Lee. Top-Down Attention Control at Feature Space for Robust Pattern Recognition. In Seong-Whan Lee, Heinrich H. Bülthoff, Tomaso Poggio, editors, Biologically Motivated Computer Vision, First IEEE International Workshop, BMVC 2000, Seoul, Korea, May 15-17, 2000, Proceedings. Volume 1811 of Lecture Notes in Computer Science, pages 129-138, Springer, 2000. [doi]
Abstract is missing.