Jung Hoon Lee, Konstantin K. Likharev. Defect-tolerant nanoelectronic pattern classifiers. I. J. Circuit Theory and Applications, 35(3):239-264, 2007. [doi]
@article{LeeL07-21,
title = {Defect-tolerant nanoelectronic pattern classifiers},
author = {Jung Hoon Lee and Konstantin K. Likharev},
year = {2007},
doi = {10.1002/cta.410},
url = {https://doi.org/10.1002/cta.410},
researchr = {https://researchr.org/publication/LeeL07-21},
cites = {0},
citedby = {0},
journal = {I. J. Circuit Theory and Applications},
volume = {35},
number = {3},
pages = {239-264},
}