Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Jung Hoon Lee, Konstantin K. Likharev. Defect-tolerant nanoelectronic pattern classifiers. I. J. Circuit Theory and Applications, 35(3):239-264, 2007. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Defect-Tolerant Hybrid CMOS/Nanoelectronic CircuitsKonstantin Likharev. dft 2008: 504-504 [doi]
The following publications are possibly variants of this publication: