Gichan Lee, Scott Uk-Jin Lee. An Empirical Comparison of Model-Agnostic Techniques for Defect Prediction Models. In Tao Zhang, Xin Xia, Nicole Novielli, editors, IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2023, Taipa, Macao, March 21-24, 2023. pages 179-189, IEEE, 2023. [doi]
Abstract is missing.