SRAM word-oriented redundancy methodology using built in self-repair

Jihyun Lee, Young-Jun Lee, Yong-Bin Kim. SRAM word-oriented redundancy methodology using built in self-repair. In Proceedings 2004 IEEE International SOC Conference, September 12-15, 2004, Hilton Santa Clara, CA, USA. pages 219-222, IEEE, 2004. [doi]

Authors

Jihyun Lee

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Young-Jun Lee

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Yong-Bin Kim

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