2 Bit-Cell, Dual-Port Access, and 51.2Gb/s Read Throughput for Automotive and Edge AI Applications - researchr publication authors

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Po-Hao Lee, Chia-Fu Lee, Hon-Jarn Lin, Cheng-Han Lu, Yen-An Chang, Pranata W. Sanjaya, Chia-Jung Tsen, Kuan-Chun Chen, Ming-Chieh Lin, Chao-Jung Hung, Tan-Li Chou, Chih-Hui Weng, Chia-Yu Wang, J.-J. Wu, Harry Chuang, Yih Wang, Yu-Der Chih, Tsung-Yung Jonathan Chang. 2 Bit-Cell, Dual-Port Access, and 51.2Gb/s Read Throughput for Automotive and Edge AI Applications. In IEEE International Solid-State Circuits Conference, ISSCC 2026, San Francisco, CA, USA, February 15-19, 2026. pages 260-262, IEEE, 2026. [doi]

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