Sang-Gi Lee, Su Lim, Chang-Eun Lee, Jeong Su Park, Sun-Kyung Bang, Sung-Hyun Kang, Russel A. Martin, Sanghoon Bae, Jin-Won Park. Leakage characteristics for the buried photodiode structure on vertical CMOS image sensors. In Russel A. Martin, Jeffrey M. DiCarlo, Nitin Sampat, editors, Digital Photography III, San Jose, CA, USA, January 29-30, 2007. Volume 6502 of SPIE Proceedings, pages 650206, SPIE, 2007. [doi]
@inproceedings{LeeLLPBKMBP07,
title = {Leakage characteristics for the buried photodiode structure on vertical CMOS image sensors},
author = {Sang-Gi Lee and Su Lim and Chang-Eun Lee and Jeong Su Park and Sun-Kyung Bang and Sung-Hyun Kang and Russel A. Martin and Sanghoon Bae and Jin-Won Park},
year = {2007},
doi = {10.1117/12.704747},
url = {http://dx.doi.org/10.1117/12.704747},
researchr = {https://researchr.org/publication/LeeLLPBKMBP07},
cites = {0},
citedby = {0},
pages = {650206},
booktitle = {Digital Photography III, San Jose, CA, USA, January 29-30, 2007},
editor = {Russel A. Martin and Jeffrey M. DiCarlo and Nitin Sampat},
volume = {6502},
series = {SPIE Proceedings},
publisher = {SPIE},
isbn = {978-0-8194-6615-0},
}