Detection of Abnormal Iris Authentication

Jaehoon Lee, Sang Hwa Lee, Jong-Il Park. Detection of Abnormal Iris Authentication. In IEEE International Conference on Consumer Electronics, ICCE 2019, Las Vegas, NV, USA, January 11-13, 2019. pages 1-2, IEEE, 2019. [doi]

Authors

Jaehoon Lee

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Sang Hwa Lee

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Jong-Il Park

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