Jaehoon Lee, Sang Hwa Lee, Jong-Il Park. Detection of Abnormal Iris Authentication. In IEEE International Conference on Consumer Electronics, ICCE 2019, Las Vegas, NV, USA, January 11-13, 2019. pages 1-2, IEEE, 2019. [doi]
@inproceedings{LeeLP19,
title = {Detection of Abnormal Iris Authentication},
author = {Jaehoon Lee and Sang Hwa Lee and Jong-Il Park},
year = {2019},
doi = {10.1109/ICCE.2019.8661910},
url = {https://doi.org/10.1109/ICCE.2019.8661910},
researchr = {https://researchr.org/publication/LeeLP19},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {IEEE International Conference on Consumer Electronics, ICCE 2019, Las Vegas, NV, USA, January 11-13, 2019},
publisher = {IEEE},
isbn = {978-1-5386-7910-4},
}