Taehoon Lee, Sungmin Lee, Woo Young Sim, Yu Mi Jung, Sunmi Han, Chanil Chung, Jay Junkeun Chang, Hyeyoung Min, Sungroh Yoon. Robust classification of DNA damage patterns in single cell gel electrophoresis. In 35th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2013, Osaka, Japan, July 3-7, 2013. pages 3666-3669, IEEE, 2013. [doi]
Abstract is missing.