Assessing the Impact of DoS Attacks on IoT Gateway

Yungee Lee, Wangkwang Lee, Giwon Shin, Kyungbaek Kim. Assessing the Impact of DoS Attacks on IoT Gateway. In James Jong Hyuk Park, Shu-Ching Chen, Kim-Kwang Raymond Choo, editors, Advanced Multimedia and Ubiquitous Engineering - MUE/FutureTech 2017, Seoul, Korea, 22-24 May 2017. Volume 448 of Lecture Notes in Electrical Engineering, pages 252-257, 2017. [doi]

Abstract

Abstract is missing.