An in-depth empirical analysis of patent citation counts using zero-inflated count data model: The case of KIST

Yong-Gil Lee, Jeong-Dong Lee, Yong-Il Song, Se-Jun Lee. An in-depth empirical analysis of patent citation counts using zero-inflated count data model: The case of KIST. Scientometrics, 70(1):27-39, 2007. [doi]

Abstract

Abstract is missing.