Po-Hao Lee, Chia-Fu Lee, Yi-Chun Shih, Hon-Jarn Lin, Yen-An Chang, Cheng-Han Lu, Yu-Lin Chen, Chieh-Pu Lo, Chung-Chieh Chen, Cheng-Hsiung Kuo, Tan-Li Chou, Chia-Yu Wang, J.-J. Wu, Roger Wang, Harry Chuang, Yih Wang, Yu-Der Chih, Tsung-Yung Jonathan Chang. A 16nm 32Mb Embedded STT-MRAM with a 6ns Read-Access Time, a 1M-Cycle Write Endurance, 20-Year Retention at 150°C and MTJ-OTP Solutions for Magnetic Immunity. In IEEE International Solid- State Circuits Conference, ISSCC 2023, San Francisco, CA, USA, February 19-23, 2023. pages 494-495, IEEE, 2023. [doi]
@inproceedings{LeeLSLCLCLCKCWWWCWCC23,
title = {A 16nm 32Mb Embedded STT-MRAM with a 6ns Read-Access Time, a 1M-Cycle Write Endurance, 20-Year Retention at 150°C and MTJ-OTP Solutions for Magnetic Immunity},
author = {Po-Hao Lee and Chia-Fu Lee and Yi-Chun Shih and Hon-Jarn Lin and Yen-An Chang and Cheng-Han Lu and Yu-Lin Chen and Chieh-Pu Lo and Chung-Chieh Chen and Cheng-Hsiung Kuo and Tan-Li Chou and Chia-Yu Wang and J.-J. Wu and Roger Wang and Harry Chuang and Yih Wang and Yu-Der Chih and Tsung-Yung Jonathan Chang},
year = {2023},
doi = {10.1109/ISSCC42615.2023.10067837},
url = {https://doi.org/10.1109/ISSCC42615.2023.10067837},
researchr = {https://researchr.org/publication/LeeLSLCLCLCKCWWWCWCC23},
cites = {0},
citedby = {0},
pages = {494-495},
booktitle = {IEEE International Solid- State Circuits Conference, ISSCC 2023, San Francisco, CA, USA, February 19-23, 2023},
publisher = {IEEE},
isbn = {978-1-6654-9016-0},
}