S. Daniel Lee, Tom Middleton. Behavioral Simulation of VLSI Test System Aids Debugging and Analysis of Test Programs. In Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984. pages 614-620, IEEE Computer Society, 1984.
@inproceedings{LeeM84,
title = {Behavioral Simulation of VLSI Test System Aids Debugging and Analysis of Test Programs},
author = {S. Daniel Lee and Tom Middleton},
year = {1984},
tags = {program analysis, testing, analysis, debugging},
researchr = {https://researchr.org/publication/LeeM84},
cites = {0},
citedby = {0},
pages = {614-620},
booktitle = {Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984},
publisher = {IEEE Computer Society},
}