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Micro interaction metrics for defect prediction

Taek Lee, Jaechang Nam, DongGyun Han, Sunghun Kim, Hoh Peter In. Micro interaction metrics for defect prediction. In Tibor Gyimóthy, Andreas Zeller, editors, SIGSOFT/FSE'11 19th ACM SIGSOFT Symposium on the Foundations of Software Engineering (FSE-19) and ESEC'11: 13rd European Software Engineering Conference (ESEC-13), Szeged, Hungary, September 5-9, 2011. pages 311-321, ACM, 2011. [doi]

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