High durability in NAND flash memory through effective page reuse mechanisms

Kwangyoon Lee, Alex Orailoglu. High durability in NAND flash memory through effective page reuse mechanisms. In Tony Givargis, Adam Donlin, editors, Proceedings of the 8th International Conference on Hardware/Software Codesign and System Synthesis, CODES+ISSS 2010, part of ESWeek 10 Sixth Embedded Systems Week, Scottsdale, AZ, USA, October 24-28, 2010. pages 205-212, ACM, 2010. [doi]

Abstract

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