Yoon Hyeok Lee, Youngmin Oh, Gyohun Jeong, Mingyu Pi, Hyukil Kwon, Hakyoung Lim, Eungchae Kim, Sunghee Lee, Bosun Hwang. GRAFT: Graph-Assisted Reinforcement Learning for Automated SSD Firmware Testing. In IEEE/ACM International Conference on Computer Aided Design, ICCAD 2023, San Francisco, CA, USA, October 28 - Nov. 2, 2023. pages 1-8, IEEE, 2023. [doi]
@inproceedings{LeeOJPKLKLH23,
title = {GRAFT: Graph-Assisted Reinforcement Learning for Automated SSD Firmware Testing},
author = {Yoon Hyeok Lee and Youngmin Oh and Gyohun Jeong and Mingyu Pi and Hyukil Kwon and Hakyoung Lim and Eungchae Kim and Sunghee Lee and Bosun Hwang},
year = {2023},
doi = {10.1109/ICCAD57390.2023.10323794},
url = {https://doi.org/10.1109/ICCAD57390.2023.10323794},
researchr = {https://researchr.org/publication/LeeOJPKLKLH23},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {IEEE/ACM International Conference on Computer Aided Design, ICCAD 2023, San Francisco, CA, USA, October 28 - Nov. 2, 2023},
publisher = {IEEE},
isbn = {979-8-3503-2225-5},
}