Crystallographic-orientation-dependent GIDL current in Tri-gate MOSFETs under hot carrier stress

Jae-Hoon Lee, Jong-Tae Park. Crystallographic-orientation-dependent GIDL current in Tri-gate MOSFETs under hot carrier stress. Microelectronics Reliability, 54(9-10):2315-2318, 2014. [doi]

Authors

Jae-Hoon Lee

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Jong-Tae Park

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