Jae-Hoon Lee, Jong-Tae Park. Crystallographic-orientation-dependent GIDL current in Tri-gate MOSFETs under hot carrier stress. Microelectronics Reliability, 54(9-10):2315-2318, 2014. [doi]
@article{LeeP14-18,
title = {Crystallographic-orientation-dependent GIDL current in Tri-gate MOSFETs under hot carrier stress},
author = {Jae-Hoon Lee and Jong-Tae Park},
year = {2014},
doi = {10.1016/j.microrel.2014.07.015},
url = {http://dx.doi.org/10.1016/j.microrel.2014.07.015},
researchr = {https://researchr.org/publication/LeeP14-18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {9-10},
pages = {2315-2318},
}