Chi-Chen Lee, Chi-Han Peng. Seam Removal for Patch-Based Ultra-High-Resolution Stain Normalization. In 23rd IEEE International Conference on Bioinformatics and Bioengineering, BIBE 2023, Dayton, OH, USA, December 4-6, 2023. pages 325-332, IEEE, 2023. [doi]
Abstract is missing.