A New Zero-Overhead Test Method for Low-Power AI Accelerators

Sangjun Lee, Jongho Park, Sungwhan Park, Hyemin Kim, Sungho Kang 0001. A New Zero-Overhead Test Method for Low-Power AI Accelerators. IEEE Trans. Circuits Syst. II Express Briefs, 71(5):2649-2653, May 2024. [doi]

Abstract

Abstract is missing.