Simone Lee, Ramesh Ramadoss, Michael Buck, V. M. Bright, K. C. Gupta, Y. C. Lee. Reliability testing of flexible printed circuit-based RF MEMS capacitive switches. Microelectronics Reliability, 44(2):245-250, 2004. [doi]
@article{LeeRBBGL04,
title = {Reliability testing of flexible printed circuit-based RF MEMS capacitive switches},
author = {Simone Lee and Ramesh Ramadoss and Michael Buck and V. M. Bright and K. C. Gupta and Y. C. Lee},
year = {2004},
doi = {10.1016/j.microrel.2003.09.002},
url = {http://dx.doi.org/10.1016/j.microrel.2003.09.002},
tags = {rule-based, testing, C++, reliability},
researchr = {https://researchr.org/publication/LeeRBBGL04},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {44},
number = {2},
pages = {245-250},
}