4nm Voltage Auto-Tracking SRAM Pulse Generator with Fully RC Optimized Row Auto-Tracking Write Assist Circuits

Inhak Lee, Dongwook Seo, Yunrong Li, Mijoung Kim, Sangyeop Baeck. 4nm Voltage Auto-Tracking SRAM Pulse Generator with Fully RC Optimized Row Auto-Tracking Write Assist Circuits. In IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), Honolulu, HI, USA, June 12-17, 2022. pages 218-219, IEEE, 2022. [doi]

@inproceedings{LeeSLKB22,
  title = {4nm Voltage Auto-Tracking SRAM Pulse Generator with Fully RC Optimized Row Auto-Tracking Write Assist Circuits},
  author = {Inhak Lee and Dongwook Seo and Yunrong Li and Mijoung Kim and Sangyeop Baeck},
  year = {2022},
  doi = {10.1109/VLSITechnologyandCir46769.2022.9830456},
  url = {https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830456},
  researchr = {https://researchr.org/publication/LeeSLKB22},
  cites = {0},
  citedby = {0},
  pages = {218-219},
  booktitle = {IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), Honolulu, HI, USA, June 12-17, 2022},
  publisher = {IEEE},
  isbn = {978-1-6654-9772-5},
}