Gyeongyeop Lee, Minki Suh, Minsang Ryu, Yunjong Lee, Jin-Woo Han, Jungsik Kim. Investigation Into the Degradation of DDR4 DRAM Owing to Total Ionizing Dose Effects. IEEE Access, 11:97456-97465, 2023. [doi]
@article{LeeSRLHK23,
title = {Investigation Into the Degradation of DDR4 DRAM Owing to Total Ionizing Dose Effects},
author = {Gyeongyeop Lee and Minki Suh and Minsang Ryu and Yunjong Lee and Jin-Woo Han and Jungsik Kim},
year = {2023},
doi = {10.1109/ACCESS.2023.3312926},
url = {https://doi.org/10.1109/ACCESS.2023.3312926},
researchr = {https://researchr.org/publication/LeeSRLHK23},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {11},
pages = {97456-97465},
}