Investigation Into the Degradation of DDR4 DRAM Owing to Total Ionizing Dose Effects

Gyeongyeop Lee, Minki Suh, Minsang Ryu, Yunjong Lee, Jin-Woo Han, Jungsik Kim. Investigation Into the Degradation of DDR4 DRAM Owing to Total Ionizing Dose Effects. IEEE Access, 11:97456-97465, 2023. [doi]

Abstract

Abstract is missing.