Low Power BIST Based on Scan Partitioning

JinKyu Lee, Nur A. Touba. Low Power BIST Based on Scan Partitioning. In 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. pages 33-41, IEEE Computer Society, 2005. [doi]

Authors

JinKyu Lee

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Nur A. Touba

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